关于我们

sentronics metrology provides metrology products focused on providing quality control and assurance for wafers & semiconductors based on optical interferometry, which permits extremely fast and highly accurate determination of layer thicknesses and 3-dimensional surface topographies, including roughness and thicknesses.

展示产品

Laser groove analysis with sub-μm accuracy and repeatability
Non-contact 2D roughness measurement down to the sub-nm Ra scale for all etch, grind and polish processes
Substrate thickness and TTV for framed wafers before and after dicing
Warp & thickness of blank and product wafers with and without BG-tape
Single layer measurements on multi-layer samples such as bonded wafers and all types of wafer level packaging devices
Multi layer and total thickness measurements on wafer stacks

Pre-sales

Application optimization together with our customers
Service measurements

Service & Support

Remote access
Technical support
Special feature support
Warranty and service contracts

After-sales

Repair and calibration service
Training
System Upgrades

地址
!! STORNO !! sentronics metrology GmbH
Dudenstr. 27 – 35
68167 Mannheim
Germany

电话: +49 621 84251-0
传真: +49 621 84251-200
网址: www.sentronics-metrology.com
电子邮件: 发送信息

联系人

Christof Ruef
President
电话: +49 621 842510
电子邮件: 发送信息

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