!! STORNO !! sentronics metrology GmbH

Booth number 2774


About us

sentronics metrology provides metrology products focused on providing quality control and assurance for wafers & semiconductors based on optical interferometry, which permits extremely fast and highly accurate determination of layer thicknesses and 3-dimensional surface topographies, including roughness and thicknesses.

Products and services

Laser groove analysis with sub-μm accuracy and repeatability
Non-contact 2D roughness measurement down to the sub-nm Ra scale for all etch, grind and polish processes
Substrate thickness and TTV for framed wafers before and after dicing
Warp & thickness of blank and product wafers with and without BG-tape
Single layer measurements on multi-layer samples such as bonded wafers and all types of wafer level packaging devices
Multi layer and total thickness measurements on wafer stacks


Application optimization together with our customers
Service measurements

Service & Support

Remote access
Technical support
Special feature support
Warranty and service contracts


Repair and calibration service
System Upgrades

!! STORNO !! sentronics metrology GmbH
Dudenstr. 27 – 35
68167 Mannheim

Phone: +49 621 84251-0
Fax: +49 621 84251-200
Internet: www.sentronics-metrology.com
E-mail: Send message

Contact person

Christof Ruef
Phone: +49 621 842510
E-mail: Send message

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Get in contact

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