About us

FEINMETALL offers comprehensive contacting solutions for the electronics, automotive and semiconductor industries and makes a significant contribution to reliability in testing technology and quality assurance. The two product groups are contact probes for contacting PCBs, wire harnesses and other electronic devices as well as wafer probe cards. This combination of contact solutions leads to an outstanding competence in terms of precision at the limits of feasibility.   Since more than 50 years FEINMETALL is a reliable partner of the worldwide high-tech and automotive industry.   The company is set up globally with headquarters in Herrenberg, Germany, and subsidiaries in the US, in the Czech Republic, in Mexico, Tunisia, Singapore, Taiwan and China.

Products and services

FEINMETALL offers a wide range of contact probes for the electronics, automotive and semiconductor industry as well as wafer probe cards. Our proximity to the market and customers, as well as our many years of experience in developing and manufacturing wafer probe cards, form a strong basis for functional, innovative and economical products. As market leader for wafer probe cards for the automotive industry FEINMETALL especially provides sophisticated and clever contact solutions for this industry. The whole probe card portfolio includes:

  • Fine-pitch applications down to 40 μm
  • High current applications up to 5 A
  • Radio frequency applications up to 100 GHz
  • Excellent pad (aluminum, copper and other alloys), solder bump and copper pillar probing
  • Reliable probe card from -55°C to +180°C
  • Multiple million TDs
  • Customized solutions for light and gyro sensors, nitrogen flush and non-magnetic
  • Turnkey services and worldwide support in all fields of wafer testing and surrounding ATE-system
Contact Probes

Further reading

Probe Card for Wafer Test

Further reading

Zeppelinstr. 8
71083 Herrenberg

Phone: +49 7032 20010
Internet: www.feinmetall.de
E-mail: Send message

Contact person

Claudia Heidenreich
Marketing Services
Phone: +49 7032 2001203
E-mail: Send message

No. 308, Service Apartment, German center
201203 Shanghai
P. R. China

Phone: +86 21 28986848
Fax: +86 21 28986848
Internet: www.feinmetall.com
E-mail: Send message

News & Innovations

ViProbe®II - The Next Generation Probe Cards for Wafer Test
For more than twenty years, FEINMETALL's vertical probe card technology, called ViProbe®, has been among the leading test solutions in wafer test. Numerous advantages, such as the stable contact quality of the probe card, the easy replacement of the contact elements and the outstanding temperature stability make this solution the market leader, especially for requirements from the automotive industry.

With the introduction of the next generation - ViProbe®II, short for ViProbe® Long Lifetime - these advantages are complemented by additional mechanisms for life extension and protection of the wafer.

The advantages:

- Precise solution for the wafer test, even for the smallest test grid and over the entire temperature range
- Easy replacement of individual contact elements and exchange of probes by the customer possible which leads to the market leading TCO in the long term (Total Cost of Ownership)
- Project-specific use: testing of pads with copper surfaces, fine-pitch applications with grids of 40 μm or a high number of contact elements of tens of thousands in one probe head
- Multiple lifetime extension due to FEINMETALL patented shimming
- Advanced safety features of the test head


Minimum test pattern: 40 µm
Diameter of the contact element: up to 1.1 mil
Max surface of test grid: up to 105 mm x 105 mm
Max number of contact elements: tens of thousands
Covered temperature range: from -55°C to 180°C
Current carrying capacity at RT: up to 800 mA continuous, pulsed on request
Contact force at recommended overdrive: from 2.2 cN to 10.8 cN

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