Stratus Vision GmbH a sister company of EPP Electronic Production Partners GmbH, designs and produces AOI (Automated Optical Inspection) systems and technology since 2003, with offices and Agents in Hong Kong, Taiwan, Korea, Germany and USA. Our Core Technology is: Defect Inspection of Ceramic Mulitlayer Hybrids, LTCCs, HTCCs, interposers, sensors and other substrates. 2D and 3D metrology can be integrated with the 100% inspection. The STRATUS VISION AOI Systems will find typical defects (on wet or dry layers). In-Line and Off-Line Inspection as well as any degree of automation can be delivered. Cooperation with Leica for high precision wafer inspection.
STRATUS 3D inspection: • (Z) Lateral resolutions from 0.5μm, • X/Y resolutions 20μm - 1μm per pixel for micron size defects on circuits • Substrates up to 10 inch (250mm)
AOI STRATUS NANO inspection: • X/Y resolutions 2μm - 0.2μm per pixel for sub micron defects on circuits • Substrates up to 12 inch (300mm).
STRATUS MICRO inspection: • X/Y resolutions 20μm - 1μm per pixel for micron size defects on circuits • Substrates up to 24 inch (600mm)
Phone: +49 89 82998910
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